Title: | A customizable software tool for Hardware in the Loop tests |
Authors: | Eider, Markus Kunze, Stefan Dorner, Wolfgang |
Citation: | 2016 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2016, Czech Republic, p.69-74. |
Issue Date: | 2016 |
Publisher: | Západočeská univerzita v Plzni |
Document type: | konferenční příspěvek conferenceObject |
URI: | http://hdl.handle.net/11025/35190 |
ISBN: | 978–80–261–0601–2 (Print) 978–80–261–0602–9 (Online) |
ISSN: | 1803–7232 (Print) 1805–9597 (Online) |
Keywords: | hardware;nástroje;software;systémy zpráv;běhové prostředí;počítačová architektura;výroba elektřiny |
Keywords in different language: | hardware;instruments;software;message systems;runtime;computer architecture;power generation |
Abstract in different language: | In this paper an automated, software-based and easy to customize test tool for Hardware in the Loop (HIL) measurements is proposed. This system is originally designed for the test of a thermal power station control system. Due to its modular approach it may also be customized for a wide range of applications. The developed tool is independent of the Operating System (OS) or the used hardware platform. Especially when using embedded systems as host platform limited system resources are available. One demand is, therefore, the development of a lightweight tool. By implementing the tool in Python, which by itself provides various hardware abstraction modules, a suitable and efficient programming language is selected. To enable an easy adoption of this tool for further tests or even future projects, a modular software architecture is proposed. Therefore, the test functionality is divided into its basic core functionalities, which are then implemented in dedicated software components. Decoupled from each other and linked via a central communication system, continued development and improvement of these components is possible. |
Rights: | © Západočeská univerzita v Plzni |
Appears in Collections: | Applied Electronics 2016 Applied Electronics 2016 |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/35190
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