Title: Transient and sensitivity analysis at semi-discrete multiconductor transmission line models
Authors: Brančík, Lubomír
Citation: Electroscope. 2008, Konference EDS 2008.
EDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.
Issue Date: 2008
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: konferenční příspěvek
conferenceObject
URI: http://hdl.handle.net/11025/514
http://147.228.94.30/images/PDF/Rocnik2008/EDS_2008/brancik.pdf
ISBN: 978-80-214-3717-3
ISSN: 1802-4564
Keywords: vícevodičové přenosové vedení;přechodové jevy;semidiskrétní modely;Laplaceova transformace
Keywords in different language: multiconductor transmission lines;transients;semi-discrete models;Laplace transform
Abstract in different language: The paper deals with methods for the solution of transient phenomena and sensitivities at semi-discrete models of multiconductor transmission lines (MTL). The models are formed by a cascade connection of generalized lumped-parameter Π networks, they can be fed in arbitrary nodes, nonzero initial conditions can also be taken into account. The solutions shown here are formulated following the state-variable method. First the equations enabling to solve voltage and current distributions along the MTL wires are derived, both in the time domain and in the operational domain. Second the formulae for sensitivities of voltage and current distributions are derived, based on the s-domain solution. The sensitivities can be stated with respect to parameters of per-unit-length matrices, the MTL length and lumped parameters of the external circuits as well. In this case the time-domain solutions are obtained by using a numerical inversion of Laplace transforms. The matrices occuring in all the formulae are sparse which enables to take into account large numbers of Π sections in the models while using common PC for the computation. The Matlab language environment is used with advantages for this purpose.
Rights: Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:2008
Konference EDS 2008 (2008)

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