Title: Application of short circuit waveguide method for evaluation of inhomogenities in dielectric sample
Authors: Faktorová, Dagmar
Citation: Electroscope. 2008, Konference EDS 2008.
EDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.
Issue Date: 2008
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: konferenční příspěvek
URI: http://hdl.handle.net/11025/516
ISBN: 978-80-214-3717-3
ISSN: 1802-4564
Keywords: dielektrika;kompozit;mikrovlnná diagnostika;testování materiálů
Keywords in different language: dielectric;composite;microwave diagnostics;material testing
Abstract in different language: In the paper main consideration is paid to investigation of inhomogenities in dielectric sample from the standpoint of their impedance properties and reflected signal amplitude. Such application include inspecting modern materials such as composites, detecting and characterizing surface and volume flaws, and evaluating the compressive strength of cement structures.The paper deals with measurement of reflex coefficient in dependence on crack depth on dielectric samples on microwave frequencies from the X –band. Evaluations are made by means of quantities used in microwave technique. Obtained quantities are compared with each other and also with analogous to the quantities measured at the same conditions on metal sample.
Rights: Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:2008
Konference EDS 2008 (2008)

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