Full metadata record
| DC pole | Hodnota | Jazyk |
|---|---|---|
| dc.contributor.author | Brutscheck, M. | |
| dc.contributor.author | Schmidt, B. | |
| dc.contributor.author | Franke, M. | |
| dc.contributor.author | Schwarzbacher, Th. | |
| dc.contributor.author | Becker, St. | |
| dc.contributor.editor | Pihera, Josef | |
| dc.contributor.editor | Steiner, František | |
| dc.date.accessioned | 2012-10-16T12:04:44Z | |
| dc.date.available | 2012-10-16T12:04:44Z | |
| dc.date.issued | 2009 | |
| dc.identifier.citation | Electroscope. 2009, Konference EDS 2009. | cs |
| dc.identifier.issn | 1802-4564 | |
| dc.identifier.uri | http://147.228.94.30/images/PDF/Rocnik2009/EDS_2009/brutscheck.pdf | |
| dc.identifier.uri | http://hdl.handle.net/11025/539 | |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
| dc.relation.ispartofseries | Electroscope | cs |
| dc.rights | Copyright © 2007-2010 Electroscope. All Rights Reserved. | en |
| dc.subject | nelineární integrované obvody | cs |
| dc.subject | neinvazivní analýza | cs |
| dc.title | Analysis of unknown nonlinear integrated circuits | en |
| dc.type | článek | cs |
| dc.type | konferenční příspěvek | cs |
| dc.type | conferenceObject | en |
| dc.type | article | en |
| dc.rights.access | openAccess | en |
| dc.type.version | publishedVersion | en |
| dc.description.abstract-translated | The analysis of unknown integrated circuits (ICs) has become very important over the last decade. In this context different invasive and non invasive procedures have been developed. However, destructive procedures are not suitable because they always damage the IC under investigation. Non invasive analysis procedures have the disadvantage that ICs are analysed using very complex and time consuming algorithms. This paper presents the first novel non invasive procedure to determine nonlinear binary multi input multi output (MIMO) ICs only by its input output behaviour. The algorithm presented in this paper solves unknown ICs by the abstraction of automata theory. The overall identification procedure was simulated and fully tested on IEEE ISCAS benchmark models as well as user defined models of real ICs. This paper will show that for every circuit under test the function has been successfully determined by the proposed identification procedure. | en |
| dc.subject.translated | nonlinear integrated circuits | en |
| dc.subject.translated | noninvasive analysis | en |
| dc.type.status | Peer-reviewed | en |
| Vyskytuje se v kolekcích: | Konference EDS 2009 EDS 2009 (2009) | |
Soubory připojené k záznamu:
| Soubor | Popis | Velikost | Formát | |
|---|---|---|---|---|
| brutscheck.pdf | 1,11 MB | Adobe PDF | Zobrazit/otevřít |
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