Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Melichar, Martin | |
| dc.contributor.author | Kutlwašer, Jan | |
| dc.contributor.author | Skřivanová, Nikola | |
| dc.date.accessioned | 2022-03-07T11:00:22Z | - |
| dc.date.available | 2022-03-07T11:00:22Z | - |
| dc.date.issued | 2021 | |
| dc.identifier.citation | MELICHAR, M. KUTLWAŠER, J. SKŘIVANOVÁ, N. ISSUE OF CRITICAL PARTS MARKING IN THE FIELD OF PRECISE METROLOGY. In Proceedings of the 32nd International DAAAM Virtual Symposium ''Intelligent Manufacturing & Automation. Vienna: DAAAM International,, 2021. s. 106-109. ISBN: 978-3-902734-33-4 , ISSN: 1726-9679 | cs |
| dc.identifier.isbn | 978-3-902734-33-4 | |
| dc.identifier.issn | 1726-9679 | |
| dc.identifier.uri | 2-s2.0-85123941667 | |
| dc.identifier.uri | http://hdl.handle.net/11025/47079 | |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | DAAAM International Vienna | en |
| dc.relation.ispartofseries | Proceedings of the 32nd International DAAAM Virtual Symposium ''Intelligent Manufacturing & Automation | en |
| dc.rights | © DAAAM | en |
| dc.title | ISSUE OF CRITICAL PARTS MARKING IN THE FIELD OF PRECISE METROLOGY | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | ConferenceObject | en |
| dc.rights.access | openAccess | en |
| dc.type.version | publishedVersion | en |
| dc.description.abstract-translated | In the field of higher quality management systems, such as automotive IATF 16949, aeronautics EN9100 or railway standards IRIS, unambiguous identification throughout the production process is one of the fundamental principles on which production philosophies are based. This paper deals with an attempt to influence the measurement results of a reference piece using different marking methods. Parameters were evaluated under the same environmental conditions of an accredited laboratory for the 4 tracers, and are thus suitable for statistical comparison. To understand the process and its limitations, an analysis of the measurement system (Cg/Cgk) was performed and a clear limit was established beyond which single-label methods are no longer applicable. | en |
| dc.subject.translated | metrology | en |
| dc.subject.translated | traceability | en |
| dc.subject.translated | identification | en |
| dc.subject.translated | marking | en |
| dc.identifier.doi | 10.2507/32nd.daaam.proceedings.015 | |
| dc.type.status | Peer-reviewed | en |
| dc.identifier.obd | 43934585 | |
| dc.project.ID | SGS-2019-008/Výzkum a vývoj pro inovace v oboru strojírenská technologie - technologie obrábění III. | cs |
| Appears in Collections: | Konferenční příspěvky / Conference papers (KTO) OBD | |
Files in This Item:
| File | Size | Format | |
|---|---|---|---|
| 015_DAAAM_Melichar_Kutwašer_Sřivanová.pdf | 964,19 kB | Adobe PDF | View/Open |
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