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dc.contributor.authorBrutscheck, M.
dc.contributor.authorFranke, M.
dc.contributor.authorSchwarzbacher, Th.
dc.contributor.authorBecker, St.
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.identifier.citationElectroscope. 2008, Konference EDS 2008.cs
dc.identifier.citationEDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.cs
dc.format4 s.
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.rightsCopyright © 2007-2010 Electroscope. All Rights Reserved.en
dc.subjectintegrované obvody CMOScs
dc.subjectanalýza integrovaných obvodůcs
dc.subjecttestovací vektorycs
dc.subjectneinvazivní klasifikační metodycs
dc.titleInvestigation and Implementation of Test Vectors for Efficient IC Analysisen
dc.typekonferenční příspěvekcs
dc.description.abstract-translatedUp until now, the efficient and structured analysis of unknown CMOS integrated circuits (ICs) has become a topic of great relevance. In the last decade different invasive and non-invasive strategies have been developed to analyse unknown ICs. However, invasive procedures always lead to the destruction of the system under investigation. Non-invasive approaches published so far have the disadvantage that ICs are analysed using very complex algorithms. Here, no division is carried out to avoid extensive analysis times in the case that only simple structures are investigated. This paper describes the investigation and implementation of test vectors for efficient IC analysis. To demonstrate the correct operation the non-invasive classification procedure will be used. Furthermore, in this research the properties of several test vectors will be analysed and implemented into analysis environment. All sections of the procedure proposed are simulated and fully tested on ISCAS-85, ISCAS-89 and ISCAS-99 benchmark or user defined models of real ICs and the results are presented in this paper. In every circuit analysed the behaviour has been successfully determined by the use of the proposed test vectors.en
dc.subject.translatedCMOS integrated circuitsen
dc.subject.translatedanalysis of integrated circuitsen
dc.subject.translatedtest vectorsen
dc.subject.translatednon-invasive classification methodsen
Appears in Collections:2008
Konference EDS 2008 (2008)

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