Full metadata record
DC pole | Hodnota | Jazyk |
---|---|---|
dc.contributor.author | Tavas, V. | |
dc.contributor.author | Demirkol, A. S. | |
dc.contributor.author | Ozoguz, S. | |
dc.contributor.author | Kilinc, Selcuk | |
dc.contributor.author | Toker, A. | |
dc.contributor.author | Zeki, A. | |
dc.contributor.editor | Pihera, Josef | |
dc.contributor.editor | Steiner, František | |
dc.date.accessioned | 2012-10-30T13:46:20Z | |
dc.date.available | 2012-10-30T13:46:20Z | |
dc.date.issued | 2010 | |
dc.identifier.citation | Electroscope. 2010, č. 2, výběr z konference Applied Electronics 2010. | cs |
dc.identifier.issn | 1802-4564 | |
dc.identifier.uri | http://147.228.94.30/images/PDF/Rocnik2010/Cislo2_2010_Applied_Electronics_2010/r4c2c5.pdf | |
dc.identifier.uri | http://hdl.handle.net/11025/569 | |
dc.format | 4 s. | cs |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
dc.relation.ispartofseries | Electroscope | cs |
dc.rights | Copyright © 2007-2010 Electroscope. All Rights Reserved. | en |
dc.subject | generátory náhodných čísel | cs |
dc.subject | metoda výběru vzorku | cs |
dc.title | An IC random number generator based on chaos | en |
dc.type | konferenční příspěvek | cs |
dc.type | conferenceObject | en |
dc.rights.access | openAccess | en |
dc.type.version | publishedVersion | en |
dc.description.abstract-translated | In this work, an integrated random number generator based on oscillator sampling method is presented. The random number generator exploits a continuous-time chaotic circuit as the entropy source. A source-coupled multivibrator is used to transform the generated chaotic signal into jittered oscillations required in the oscillator sampling method. The random number generator circuit is fabricated using 0.35μm CMOS process. The circuit is supplied with ±1.65V and occupies an area of 0.25mm2. The throughput of the RNG is 2Mbit/s and its average power consumption is measured as 35mW at its typical throughput. It is shown that experimental binary data obtained from the fabricated IC pass the four tests of FIPS-140-1 test suite. | en |
dc.subject.translated | random number generator | en |
dc.subject.translated | sampling method | en |
dc.type.status | Peer-reviewed | en |
Vyskytuje se v kolekcích: | Číslo 2 - Applied Electronics 2010 (2010) Číslo 2 - Applied Electronics 2010 (2010) |
Soubory připojené k záznamu:
Soubor | Popis | Velikost | Formát | |
---|---|---|---|---|
r4c2c5.pdf | 4 MB | Adobe PDF | Zobrazit/otevřít |
Použijte tento identifikátor k citaci nebo jako odkaz na tento záznam:
http://hdl.handle.net/11025/569
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