Full metadata record
DC pole | Hodnota | Jazyk |
---|---|---|
dc.contributor.author | Vyroubal, Petr | |
dc.contributor.editor | Pihera, Josef | |
dc.contributor.editor | Steiner, František | |
dc.date.accessioned | 2013-12-18T11:09:02Z | |
dc.date.available | 2013-12-18T11:09:02Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | Electroscope. 2013, č. 5, EEICT + EDS. | cs |
dc.identifier.issn | 1802-4564 | |
dc.identifier.uri | http://147.228.94.30/images/PDF/Rocnik2013/Cislo5_2013/r7c5c3.pdf | |
dc.identifier.uri | http://hdl.handle.net/11025/6619 | |
dc.format | 5 s. | cs |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
dc.relation.ispartofseries | Electroscope | cs |
dc.rights | © 2013 Electroscope. All rights reserved. | en |
dc.subject | rázová vlna | cs |
dc.subject | scintilační detektor | cs |
dc.subject | mikroskopické metody | cs |
dc.subject | environmentální rastrovací elektronový mikroskop | cs |
dc.subject | počítačová simulace | cs |
dc.title | The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope | en |
dc.type | článek | cs |
dc.type | article | en |
dc.rights.access | openAccess | en |
dc.type.version | publishedVersion | en |
dc.description.abstract-translated | Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, especially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. The evaluation of pressure on the secondary electrons trajectory is one of the important parameter in design of scintillation detector of secondary electrons. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of microscope. | en |
dc.subject.translated | shock wave | en |
dc.subject.translated | scintilation detector | en |
dc.subject.translated | microscopic methods | en |
dc.subject.translated | environmental scanning electron microscope | en |
dc.subject.translated | computer simulation | en |
dc.type.status | Peer-reviewed | en |
Vyskytuje se v kolekcích: | Číslo 5 (2013) Číslo 5 (2013) |
Soubory připojené k záznamu:
Soubor | Popis | Velikost | Formát | |
---|---|---|---|---|
r7c5c3.pdf | Plný text | 363,04 kB | Adobe PDF | Zobrazit/otevřít |
Použijte tento identifikátor k citaci nebo jako odkaz na tento záznam:
http://hdl.handle.net/11025/6619
Všechny záznamy v DSpace jsou chráněny autorskými právy, všechna práva vyhrazena.