| Title: | Method for qualification cleaning of electronic assemblies, validation of process changes in cleaning process |
| Authors: | Sítko, Vladimír |
| Citation: | Electroscope. 2018, č. 1. |
| Issue Date: | 2018 |
| Publisher: | Západočeská univerzita v Plzni, Fakulta elektrotechnická |
| Document type: | článek article |
| URI: | http://147.228.94.30/images/PDF/Rocnik2018/Cislo1_2018/r12c1c6.pdf http://hdl.handle.net/11025/31001 |
| ISSN: | 1802-4564 |
| Keywords: | elektronické sestavy;čistící proces;optické měření;měření iontové kontaminace |
| Keywords in different language: | electronic assemblies;cleaning process;optical measurement;ionic contamination measurement |
| Abstract in different language: | The described experiment was designed to verify and demonstrate current situation in determining cleanliness of electronic assemblies with leadless and high dense components. We have compared the historically introduced method of ionic contamination measuring with new optical method of determining flux residues under component with very thin gap. It should be interpreted as a confirmation of just released Addendum of IPC J STD 001 standard, which definitely state, that ionic contamination measurement ( ROSE method) cannot give an objective evidence of cleanliness of SMT electronic assembly and prediction of reliability. |
| Rights: | Copyright © 2018 Electroscope. All Rights Reserved. |
| Appears in Collections: | Číslo 1 (2018) Číslo 1 (2018) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| r12c1c6.pdf | Plný text | 735,58 kB | Adobe PDF | View/Open |
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