| Název: | Using chaos eye method to diagnose power capacitors |
| Autoři: | Wang, Meng-Hui Hsieh, Meng-Ju Lu, Shiue-Der Ye, Guang-Ci Yu, Kuo-Nan Lai, Hsiang-Yueh |
| Citace zdrojového dokumentu: | 2017 International Conference on Applied Electronics: Pilsen, 5th – 6th September 2017, Czech Republic, p.273-278. |
| Datum vydání: | 2017 |
| Nakladatel: | Západočeská univerzita v Plzni |
| Typ dokumentu: | konferenční příspěvek conferenceObject |
| URI: | http://hdl.handle.net/11025/35452 |
| ISBN: | 978–80–261–0641–8 (Print) 978–80–261–0642–5 (Online) |
| ISSN: | 1803–7232 (Print) 1805–9597 (Online) |
| Klíčová slova: | metoda detekce synchronizace chaosu;diagnostika poruchy;partial discharge;výkonové kondenzátory |
| Klíčová slova v dalším jazyce: | chaos synchronization detection method;fault diagnosis;partial discharge;power capacitators |
| Abstrakt v dalším jazyce: | This study focused on the measurement and diagnostic analysis of partial discharge in power capacitors operating under prolonged periods of high voltage. An off-line test was conducted on two power capacitors, which were subjected to defect preprocessing before the experiment. The partial discharge test of the terminal to the outer casing was carried out using a 24kV high voltage transformer. The voltage of the power discharge, after which the voltage signals of the test voltage and the partial discharge were extracted. The characteristics of the discharge signal were identified using an oscilloscope. The chaos synchronization detection method was then employed to establish a chaotic error scatter plot for the discharge voltage he gravity (chaos eye) of the error scatter plot was used as the fault diagnosis feature. The advantage of this approach was the drastic reduction of the amount of data for feature extraction, and the effective detection of the slight discharge signal variation in power capacitors, thereby anticipating their operation and enabling the implementation of preemptive contingency measures to avoid major accidents. |
| Práva: | © Západočeská univerzita v Plzni |
| Vyskytuje se v kolekcích: | Applied Electronics 2017 Applied Electronics 2017 |
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|---|---|---|---|---|
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