Title: Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2
Authors: Bergmann, Benedikt
Smolyanskiy, Petr
Burian, Petr
Pospíšil, Stanislav
Citation: BERGMANN, B. SMOLYANSKIY, P. BURIAN, P. POSPÍŠIL, S. Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2 . Journal of Instrumentation, 2022, roč. 17, č. 1, s. nestránkováno. ISSN: 1748-0221
Issue Date: 2022
Publisher: IOP Publishing
Document type: článek
article
URI: 2-s2.0-85125543199
http://hdl.handle.net/11025/51326
ISSN: 1748-0221
Keywords in different language: pattern recognition, cluster finding, calibration and fitting methods;radiation monitoring;spectrometers
Abstract: In the present work, we study the Timepix2 pixels' high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case.
Abstract in different language: In the present work, we study the Timepix2 pixels' high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case.
Rights: Plný text není přístupný.
© IOP Publishing Ltd and Sissa Medialab
Appears in Collections:Články / Articles (RICE)
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