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dc.contributor.authorĎurman, Vladimír
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.date.accessioned2013-07-04T10:40:40Z-
dc.date.available2013-07-04T10:40:40Z-
dc.date.issued2012
dc.identifier.citationElectroscope. 2012, č. 3.cs
dc.identifier.issn1802-4564
dc.identifier.urihttp://147.228.94.30/images/PDF/Rocnik2012/Cislo3_2012/r6c4c8.pdf
dc.identifier.urihttp://hdl.handle.net/11025/5897
dc.format5 s.
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.relation.ispartofseriesElectroscopecs
dc.rights© 2012 Electroscope. All rights reserved.en
dc.subjectelektrotechnická diagnostikacs
dc.subjectelektrická izolacecs
dc.subjectdielektrikacs
dc.titleFactors affecting the results of electrical insulation diagnostic testsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedIn this paper the influence of some transient phenomena on the results of dielectric measurements is discussed. The investigation is concerned with the region of very low frequencies or the region of very long times. Based on the solution of Maxwell equations three phenomena were analyzed: the effect of incomplete charging on the values of discharging current, the effect of a deform shape of the step voltage at charging and the effect of multiple periods at evaluation of the alternating current measurements. The results of modeling showed, that the minimum charging time for achieving acceptable results at discharging currents responds approximately to the 50 times of the relaxation time constant. The charging voltage at all experiments has to be checked for its individual time constant. An inadequate long time constant disable us to reveal the parameters of the investigating relaxation process. In the frequency domain, especially in the very low frequency range, it is possible to obtain reliable results after application of minimum three periods of the sinusoidal voltage. Except of this, the paper also provides computational bases for estimation of the differences caused by non-ideal conditions at dielectric measurements.en
dc.subject.translatedelectrotechnical diagnosticsen
dc.subject.translatedelectrical insulationen
dc.subject.translateddielectricen
dc.type.statusPeer-revieweden
Appears in Collections:Číslo 3 (2012)
Číslo 3 (2012)

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