Full metadata record
DC pole | Hodnota | Jazyk |
---|---|---|
dc.contributor.author | Feitosa, Raul Queiroz | |
dc.contributor.author | Mota, Guilherme | |
dc.contributor.author | Paciornik, Sidnei | |
dc.contributor.editor | Skala, Václav | |
dc.date.accessioned | 2014-05-29T06:52:34Z | |
dc.date.available | 2014-05-29T06:52:34Z | |
dc.date.issued | 2001 | |
dc.identifier.citation | WSCG '2001: Conference proceedings: The 9-th International Conference in Central Europe on Computer Graphics, Visualization and Computer Vision 2001: University of West Bohemia, Plzen, Czech Republic, February 5.-9., 2001, p. 71-78. | en |
dc.identifier.isbn | 80-7082-713-0 | |
dc.identifier.issn | 1213-6972 | |
dc.identifier.uri | http://wscg.zcu.cz/wscg2001/Papers_2001/R357.pdf | |
dc.identifier.uri | http://hdl.handle.net/11025/11253 | |
dc.description.abstract | The problem of detecting specific patterns in images of materials obtained through High Resolution Transmission Electron Microscopy is addressed. A supervised classification method is proposed using an extension of Principal Component Analysis and a new a procedure for building the training set. Experiments on two different types of images indicate that the proposed method is superior to the conventional cross-correlation approach. Moreover, using the same number of components, the new dimensionality reduction approach shows a better performance than the standard PCA method. | en |
dc.format | 8 s. | cs |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | University of West Bohemia | en |
dc.relation.ispartofseries | WSCG '2001: Conference proceedings | en |
dc.rights | © University of West Bohemia | en |
dc.subject | rozpoznávání vzorů | cs |
dc.subject | redukce dimezionality | cs |
dc.subject | charakterizace materiálů | cs |
dc.subject | elektronová mikroskopie | cs |
dc.title | An Alternative Approach for Pattern Detection Applied to Materials Characterization | en |
dc.type | konferenční příspěvek | cs |
dc.type | conferenceObject | en |
dc.rights.access | openAccess | en |
dc.type.version | publishedVersion | en |
dc.subject.translated | pattern recognition | en |
dc.subject.translated | dimensionality reduction | en |
dc.subject.translated | materials characterization | en |
dc.subject.translated | electron microscopy | en |
dc.type.status | Peer-reviewed | en |
Vyskytuje se v kolekcích: | WSCG '2001: Conference proceedings |
Soubory připojené k záznamu:
Soubor | Popis | Velikost | Formát | |
---|---|---|---|---|
Feitosa.pdf | Plný text | 687,64 kB | Adobe PDF | Zobrazit/otevřít |
Použijte tento identifikátor k citaci nebo jako odkaz na tento záznam:
http://hdl.handle.net/11025/11253
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