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DC poleHodnotaJazyk
dc.contributor.authorJanoušek, Ladislav
dc.contributor.authorGombárska, Daniela
dc.contributor.authorČápová, Klára
dc.contributor.editorUlrych, Bohuš
dc.date.accessioned2017-04-03T06:41:21Z
dc.date.available2017-04-03T06:41:21Z
dc.date.issued2007
dc.identifier.citationAMTEE ’07 : seventh international conference on Advanced Methods in the Theory of Electrical Engineering : September 10-12, 2007 [Pilsen, Czech Republic].en
dc.identifier.isbn978-80-7043-564-9
dc.identifier.urihttp://amtee.zcu.cz/AMTEE/ArchivedProceedings/proceedings_AMTEE_2007/data/section_i.html
dc.identifier.urihttp://hdl.handle.net/11025/25796
dc.format6 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.rights© University of West Bohemiaen
dc.subjectvířivé proudycs
dc.subjectnedestruktivní hodnocenícs
dc.subjecttrhlinacs
dc.subjectsondacs
dc.subjectsuperpozice signálucs
dc.subjecthloubkacs
dc.titleA new approach in eddy-current non-destructive evaluationen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedThe paper proposes a novel approach for enhancing eddy-current non-destructive evaluation. A detected crack is inspected using several probes that provide different distributions of eddy-currents. Thus, more information about the crack is obtained. The crack signals gained using the probes are superposed and unique features are extracted from the mixed signals. Numerical investigations as well as experimental verification reveal that the features provide clear indication about the depth of the detected crack. In addition, they enable one to evaluate the depth of a defect that is much deeper than the standard depth of penetration.en
dc.subject.translatededdy-currentsen
dc.subject.translatednon-destructive evaluationen
dc.subject.translatedcracken
dc.subject.translatedprobeen
dc.subject.translatedsignal superpositionen
dc.subject.translateddepthen
dc.type.statusPeer-revieweden
Vyskytuje se v kolekcích:CPEE – AMTEE 2007
CPEE – AMTEE 2007

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