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DC poleHodnotaJazyk
dc.contributor.authorMachač, Jan
dc.contributor.authorŠnajdr, Miroslav
dc.contributor.editorKarban, Pavel
dc.date.accessioned2017-04-04T07:17:19Z
dc.date.available2017-04-04T07:17:19Z
dc.date.issued2009
dc.identifier.citationAMTEE ’09 : eighth international conference on Advanced Methods in the Theory of Electrical Engineering : September 07-09, 2009 [Cheb, Czech Republic].en
dc.identifier.isbn978-80-7043-821-3
dc.identifier.urihttp://cpee.zcu.cz/AMTEE/ArchivedProceedings/proceedings_AMTEE_2009/index.html
dc.identifier.urihttp://hdl.handle.net/11025/25845
dc.format5 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.rights© University of West Bohemiaen
dc.subjectvedení vlákencs
dc.subjectkovizolantová-kovová konstrukcecs
dc.subjectnegativní vnitřní odporcs
dc.subjectV-A charakteristikacs
dc.titleNonlinear model of very thin conducting fibersen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedThe paper studies static V-A characteristics of very thin conducting fibers. The aim is to find the presence of a negative differential resistance in the characteristic. It is shown that this effect can be found only supposing that the nonlinear dependence of the metal conductivity on temperature is taken into account, i.e., the dependence including the quadratic term. Finally the system of fibers is studied with a proper statistical distribution of their conductivity. The parametric study was performed. The resulting V-A characteristics can be compared with the characteristic measured on the fabricated metal-insulator-metal structure. This comparison shows that the described model can serve as a good way to determine the V-A characteristics of MIM structures.en
dc.subject.translatedconducting fiberen
dc.subject.translatedmetal-insulator-metal structureen
dc.subject.translatednegative differential resistanceen
dc.subject.translatedV-A characteristicen
dc.type.statusPeer-revieweden
Vyskytuje se v kolekcích:CPEE – AMTEE 2009

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