Název:	Network Scanning and Mapping for IIoT Edge Node Device Security
Autoři:	Niedermaier, Matthias Fischer, Florian Merli, Dominik Sigl, Georg
Citace zdrojového dokumentu:	2019 International Conference on Applied Electronics: Pilsen, 10th – 11th September 2019, Czech Republic, p. 111-116.
Datum vydání:	2019
Nakladatel:	Západočeská univerzita v Plzni
Typ dokumentu:	konferenční příspěvek conferenceObject
URI:	http://hdl.handle.net/11025/35527
ISBN:	978–80–261–0812–2 (Online) 978–80–261–0813–9 (Print)
ISSN:	1803–7232 (Print) 1805-9597 (Online)
Klíčová slova:	síťové skenování;průmyslový interntet věcí;iiot;zabezpečení;okrajové zařízení;stavební kamen
Klíčová slova v dalším jazyce:	network scanning;iiot;industrial internet of things;security;edge device;building block
Abstrakt v dalším jazyce:	The amount of connected devices in the industrial environment is growing continuously, due to the ongoing demands of new features like predictive maintenance. New business models require more data, collected by IIoT edge node sensors based on inexpensive and low performance Microcontroller Units (MCUs). A negative side effect of this rise of interconnections is the increased attack surface, enabled by a larger network with more network services. Attaching badly documented and cheap devices to industrial networks often without permission of the administrator even further increases the security risk. A decent method to monitor the network and detect “unwanted” devices is network scanning. Typically, this scanning procedure is executed by a computer or server in each sub-network. In this paper, we introduce network scanning and mapping as a building block to scan directly from the Industrial Internet of Things (IIoT) edge node devices. This module scans the network in a pseudo-random periodic manner to discover devices and detect changes in the network structure. Furthermore, we validate our approach in an industrial testbed to show the feasibility of this approach.
Práva:	© Západočeská univerzita v Plzni
Vyskytuje se v kolekcích:	Applied Electronics 2019 Applied Electronics 2019

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