Title:	Carrier bulk-lifetime measurement during solar cell production
Authors:	Solčanský, Marek Vaněk, Jiří
Citation:	Electroscope. 2011, č. 4, EDS 2011.
Issue Date:	2011
Publisher:	Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type:	konferenční příspěvek conferenceObject
URI:	http://147.228.94.30/images/PDF/Rocnik2011/Cislo4_2011/r5c4c7.pdf http://hdl.handle.net/11025/626
ISSN:	1802-4564
Keywords:	chemická pasivace;quinhydrone;životnost nosičů náboje
Keywords in different language:	chemical passivation;quinhydrone;carrier bulk lifetime
Abstract in different language:	The main material parameter of silicon is the minority carrier bulk lifetime and influences the effectiveness of photovoltaic cells. It may change in the technological process especially during high temperature operations. Monitoring of the carrier bulk-lifetime is necessary for modifying the whole technological process of production. This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solution, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution remains from a silicon surface, so that the parameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers series in the production after a repetitive return of the measured wafer into the production process. The cleaning process itself is also a subject of a development.
Rights:	Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:	Číslo 4 - EDS 2011 (2011) Číslo 4 - EDS 2011 (2011)

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