Title: | Noise influence on 2D unwrapping |
Authors: | Kubásek, Radek Kunc, Martin |
Citation: | AMTEE ’07 : seventh international conference on Advanced Methods in the Theory of Electrical Engineering : September 10-12, 2007 [Pilsen, Czech Republic]. |
Issue Date: | 2007 |
Publisher: | University of West Bohemia |
Document type: | konferenční příspěvek conferenceObject |
URI: | http://amtee.zcu.cz/AMTEE/ArchivedProceedings/proceedings_AMTEE_2007/data/section_i.html http://hdl.handle.net/11025/25789 |
ISBN: | 978-80-7043-564-9 |
Keywords: | hluk;2D data;obraz |
Keywords in different language: | noise;2D data;image |
Abstract in different language: | Paper describe influence of additive noise on unwrapping process. Noisy 2D-data, an image, is very hard to unwrap, mainly for low S/N ratio. By denoising, we can achieve a significant better result. Paper give us a global overview and shows basic dependencies between noise and unwrapped data quality. |
Rights: | © University of West Bohemia |
Appears in Collections: | CPEE – AMTEE 2007 CPEE – AMTEE 2007 |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Kubasek.pdf | Plný text | 1,74 MB | Adobe PDF | View/Open |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/25789
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.