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DC poleHodnotaJazyk
dc.contributor.authorSteiner, František
dc.contributor.authorHirman, Martin
dc.date.accessioned2019-09-23T11:38:14Z-
dc.date.available2019-09-23T11:38:14Z-
dc.date.issued2015
dc.identifier.citation2015 International Conference on Applied Electronics: Pilsen, 8th – 9th September 2015, Czech Republic, p.53-56.en
dc.identifier.isbn978-80-261-0385-1 (Print)
dc.identifier.isbn978-80-261-0386-8 (Online)
dc.identifier.issn1805-9597 (Online)
dc.identifier.issn978-80-261-0385-1 (Print)
dc.identifier.urihttp://hdl.handle.net/11025/35093
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plznics
dc.rights© University of West Bohemiaen
dc.subjectvodivá lepidlacs
dc.subjectléčenícs
dc.subjectkloubycs
dc.subjectsílacs
dc.subjectodporcs
dc.subjectkovycs
dc.subjectměření polovodičových zařízenícs
dc.titleInfluence of electrically conductive adhesive amount on shear strength of glued jointsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedThis paper deals with the influence of electrically conductive adhesive amount on shear strength of joints glued by EPO-TEK® H20S and MG 8331S. These joints were made by gluing of chip resistors 1206, 0805 and 0603 with two curing profiles for each adhesive. The different thickness of stencils and reductions of the hole in stencils were used. These differences have an effect on the amount of conductive adhesives on the samples. The curing profiles and various amounts of the adhesives have an effect on the mechanical strength of the joint. Samples were measured after curing process by using shear strength test with the device LabTest 3.030.en
dc.subject.translatedconductive adhesivesen
dc.subject.translatedcuringen
dc.subject.translatedjointsen
dc.subject.translatedforceen
dc.subject.translatedresistorsen
dc.subject.translatedmetalen
dc.subject.translatedsemiconductor device measurementen
dc.type.statusPeer-revieweden
Vyskytuje se v kolekcích:Články / Articles (KAE)
Applied Electronics 2015
Applied Electronics 2015

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